DocumentCode :
3543468
Title :
Ultra flexible pseudo-lamb wave RF resonators based on ZnO/PI and AlN/PI structures
Author :
Zhou, C.J. ; Yang, Yi ; Shu, Y. ; Zhang, Clara H. ; Tian, Hua ; Zhang, Z.H. ; Xie, Donghui ; Ren, T.L. ; Zhou, J. ; Feng, Baicheng ; Jin, Hye-Jin ; Dong, S.R.
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
A novel strategy has been proposed to implement high-performance ultra flexible RF resonators operated in the pseudo-Lamb wave modes. By integrating piezoelectric thin film (ZnO and AlN) with flexible polyimide (PI) substrate and using surface interdigital electrodes to excite acoustic waves, flexible RF resonators have been fabricated. Two-dimensional finite element analysis has been performed to study the mode shapes of the resonators and it is verified that these resonators are working in the pseudo-Lamb anti-symmetrical (A0) and symmetrical (S0) wave modes. Furthermore, the dispersive characteristics of the resonators have been theoretically calculated by using transfer matrix methods. The experimental results are in good agreement with the simulation results and theoretical calculations. As for the flexible resonator working in the S0 mode based on ZnO/PI structure, a center frequency up to 800MHz and a high quality (Q) factor up to 1000 have been obtained.
Keywords :
II-VI semiconductors; III-VI semiconductors; aluminium compounds; electrodes; finite element analysis; flexible electronics; piezoelectric thin films; polymers; surface acoustic wave resonators; wide band gap semiconductors; zinc compounds; AlN; ZnO; acoustic waves; flexible polyimide substrate; high-performance ultraflexible RF resonators; piezoelectric thin film; pseudo-Lamb antisymmetrical wave modes; surface interdigital electrodes; symmetrical wave modes; transfer matrix methods; two-dimensional finite element analysis; ultraflexible pseudo-Lamb wave RF resonators; Fabrication; Finite element methods; Optical resonators; Piezoelectric films; Resonant frequency; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6478984
Filename :
6478984
Link To Document :
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