DocumentCode :
3543538
Title :
The role of silicon, silicon carbide and gallium nitride in power electronics
Author :
Treu, M. ; Vecino, E. ; Pippan, M. ; Haberlen, O. ; Curatola, G. ; Deboy, Gerald ; Kutschak, M. ; Kirchner, U.
Author_Institution :
Infineon Technol. Austria AG, Villach, Austria
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
Silicon carbide (SiC) and latest gallium nitride (GaN) are two semiconductor materials which entered the power device arena which has been set up and still is being dominated by silicon based devices. The following paper will make a basic comparison of power devices out of these three base materials valid for medium voltage classes of some hundred to above 1000V. This paper will start with comparisons of common electrical figures of merit (FOM) and will focus less on the exact values but on the possible trends and current limits concerning the different materials. These findings will be brought in relation to application requirements.
Keywords :
III-V semiconductors; elemental semiconductors; gallium compounds; power semiconductor devices; silicon; silicon compounds; wide band gap semiconductors; FOM; GaN; Si; SiC; power device; power electronics; semiconductor materials; silicon based devices; Gallium nitride; Junctions; Quality of service; Schottky diodes; Silicon; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6478995
Filename :
6478995
Link To Document :
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