Title :
Research on image acquisition system applied to profile measurement
Author :
Jia, Zhu ; Xing-Fei, Li
Author_Institution :
State Key Lab. of Precise Meas. Technol. & Instrum., Tianjin Univ., Tianjin, China
Abstract :
Profile measurement plays an important role in machine vision. Profile imaging quality, affected by illumination, scattering characteristics, and other factors, directly determines the accuracy and repeatability of profile measurement. An image acquisition system featured with parallel projection achieved by the use of telecentric optics and parallel illumination is proposed in the study. Influencing factors of profile image acquisition are analyzed in detail. Mathematical formulas are presented for calculation of related parameters. Experimental results show that the proposed image acquisition system can efficiently improve the profile imaging quality and is beneficial to profile measurement.
Keywords :
computer vision; data acquisition; feature extraction; light scattering; optical images; spatial variables measurement; feature extraction; illumination characteristics; machine vision; parallel illumination; parallel projection; profile image acquisition system; profile imaging quality; profile measurement; scattering characteristics; telecentric optics system; Cameras; Feature extraction; Focusing; Image analysis; Instruments; Lighting; Machine vision; Optical imaging; Optical scattering; Optical sensors; image acquisition system; machine vision; profile measurement;
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
DOI :
10.1109/ICEMI.2009.5274411
