DocumentCode :
3543707
Title :
A neuromorphic visual system using RRAM synaptic devices with Sub-pJ energy and tolerance to variability: Experimental characterization and large-scale modeling
Author :
Shimeng Yu ; Bin Gao ; Zheng Fang ; Hongyu Yu ; Jinfeng Kang ; Wong, H.-S Philip
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
We report the use of metal oxide resistive switching memory (RRAM) as synaptic devices for a neuromorphic visual system. At the device level, we experimentally characterized the gradual resistance modulation of RRAM by hundreds of identical pulses. As compared with phase change memory (PCM) reported recently in [1,2], >100×-1000× energy consumption reduction was achieved in RRAM as synaptic devices (<;1 pJ per spike). Based on the experimental results, we developed a stochastic model to quantify the device switching dynamics. At the system level, we simulated the performance of image orientation selectivity on a neuromorphic visual system which consists of 1,024 CMOS neuron circuits and 16,348 RRAM synaptic devices. It was found that the system can tolerate the temporal and spatial variability which are commonly present in RRAM devices, suggesting the feasibility of large-scale hardware implementation of neuromorphic system using RRAM synaptic devices.
Keywords :
CMOS memory circuits; integrated circuit modelling; neural chips; random-access storage; stochastic processes; CMOS neuron circuits; PCM; RRAM synaptic devices; device switching dynamics; energy consumption reduction; gradual resistance modulation; large-scale modeling; metal oxide resistive switching memory; neuromorphic visual system; phase change memory; spatial variability; stochastic model; temporal variability; Electrical resistance measurement; Immune system; Neuromorphics; Neurons; Resistance; Training; Visual systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6479018
Filename :
6479018
Link To Document :
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