• DocumentCode
    3543707
  • Title

    A neuromorphic visual system using RRAM synaptic devices with Sub-pJ energy and tolerance to variability: Experimental characterization and large-scale modeling

  • Author

    Shimeng Yu ; Bin Gao ; Zheng Fang ; Hongyu Yu ; Jinfeng Kang ; Wong, H.-S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    We report the use of metal oxide resistive switching memory (RRAM) as synaptic devices for a neuromorphic visual system. At the device level, we experimentally characterized the gradual resistance modulation of RRAM by hundreds of identical pulses. As compared with phase change memory (PCM) reported recently in [1,2], >100×-1000× energy consumption reduction was achieved in RRAM as synaptic devices (<;1 pJ per spike). Based on the experimental results, we developed a stochastic model to quantify the device switching dynamics. At the system level, we simulated the performance of image orientation selectivity on a neuromorphic visual system which consists of 1,024 CMOS neuron circuits and 16,348 RRAM synaptic devices. It was found that the system can tolerate the temporal and spatial variability which are commonly present in RRAM devices, suggesting the feasibility of large-scale hardware implementation of neuromorphic system using RRAM synaptic devices.
  • Keywords
    CMOS memory circuits; integrated circuit modelling; neural chips; random-access storage; stochastic processes; CMOS neuron circuits; PCM; RRAM synaptic devices; device switching dynamics; energy consumption reduction; gradual resistance modulation; large-scale modeling; metal oxide resistive switching memory; neuromorphic visual system; phase change memory; spatial variability; stochastic model; temporal variability; Electrical resistance measurement; Immune system; Neuromorphics; Neurons; Resistance; Training; Visual systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479018
  • Filename
    6479018