DocumentCode
3543707
Title
A neuromorphic visual system using RRAM synaptic devices with Sub-pJ energy and tolerance to variability: Experimental characterization and large-scale modeling
Author
Shimeng Yu ; Bin Gao ; Zheng Fang ; Hongyu Yu ; Jinfeng Kang ; Wong, H.-S Philip
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2012
fDate
10-13 Dec. 2012
Abstract
We report the use of metal oxide resistive switching memory (RRAM) as synaptic devices for a neuromorphic visual system. At the device level, we experimentally characterized the gradual resistance modulation of RRAM by hundreds of identical pulses. As compared with phase change memory (PCM) reported recently in [1,2], >100×-1000× energy consumption reduction was achieved in RRAM as synaptic devices (<;1 pJ per spike). Based on the experimental results, we developed a stochastic model to quantify the device switching dynamics. At the system level, we simulated the performance of image orientation selectivity on a neuromorphic visual system which consists of 1,024 CMOS neuron circuits and 16,348 RRAM synaptic devices. It was found that the system can tolerate the temporal and spatial variability which are commonly present in RRAM devices, suggesting the feasibility of large-scale hardware implementation of neuromorphic system using RRAM synaptic devices.
Keywords
CMOS memory circuits; integrated circuit modelling; neural chips; random-access storage; stochastic processes; CMOS neuron circuits; PCM; RRAM synaptic devices; device switching dynamics; energy consumption reduction; gradual resistance modulation; large-scale modeling; metal oxide resistive switching memory; neuromorphic visual system; phase change memory; spatial variability; stochastic model; temporal variability; Electrical resistance measurement; Immune system; Neuromorphics; Neurons; Resistance; Training; Visual systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4673-4872-0
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2012.6479018
Filename
6479018
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