Error immunity techniques for nanomagnetic logic

Nanomagnetic logic (NML) is an alternative to electron charge-based information processing for energy efficient computing applications. However, experiments indicate that nanomagnets are susceptible to thermal and lithographic noise, resulting in logical errors during signal transmission and computation. Here, we study the origins of errors in nanomagnetic logic and present a technique for reducing error rates based on anisotropy engineering. Using photoelectron emission microscopy (PEEM), we verify the functionality and error-immunity properties of anisotropy-engineered nanomagnets in NML applications.