Title :
The design of general-purpose automatic testing and fault diagnosis system based on VXI bus
Author :
Guo, Rui ; Wang, Guoqiang ; Jiang, Yuhai ; Ye, Wei
Author_Institution :
Mech. Eng. Coll., Jilin Univ., Changchun, China
Abstract :
According to the principles of generalization, modularization, and standardization, we have designed a general testing system for large-scale and complicated electronic equipment based on VXI bus. It introduces the design principle and the structure of the hardware and the software of the general testing system in the paper. It adopts Bayesian networks representation method to represent the uncertainty information in the system. The system has important meaning to improve the test and diagnostic capability for the electromechanical device.
Keywords :
Bayes methods; automatic testing; fault diagnosis; field buses; virtual instrumentation; Bayesian networks representation method; VXI bus; electromechanical device; electronic equipment; fault diagnosis system; general-purpose automatic testing; hardware structure; software structure; testing system design principle; virtual instrumentation; Automatic testing; Bayesian methods; Electronic equipment; Electronic equipment testing; Fault diagnosis; Hardware; Large-scale systems; Software testing; Standardization; System testing; ATS; BN; Information Fusion; VXI bus;
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
DOI :
10.1109/ICEMI.2009.5274427
