Modulation and noise measurements from 1520 to 1560 nm in monolithic widely tunable semiconductor lasers

Author

Rigole, P.J. ; Schatz, R. ; Goobar, E. ; Saavedra, A.A.

Author_Institution

Lab. of Photon. & Microwave Eng., R. Inst. of Technol, Sweden

fYear

1998

fDate

3-8 May 1998

Firstpage

303

Lastpage

304

Abstract

Summary form only given. Widely tunable semiconductor lasers have a large number of applications. We believe we report for the first time measurements of intensity modulation response, frequency, and intensity noise characteristics of a grating-assisted co-directional coupler with rear sampled grating reflector (GCSR) lasers.

Keywords

diffraction gratings; distributed Bragg reflector lasers; infrared sources; laser transitions; laser tuning; noise measurement; optical directional couplers; optical testing; semiconductor device testing; semiconductor lasers; waveguide lasers; 1520 to 1560 nm; grating-assisted co-directional coupler; intensity modulation response; intensity noise characteristics; modulation measurements; monolithic widely tunable semiconductor lasers; noise measurements; rear sampled grating reflector lasers; time measurements; widely tunable semiconductor lasers; Frequency; Gratings; Intensity modulation; Laser noise; Noise measurement; Optical coupling; Semiconductor device noise; Semiconductor lasers; Time measurement; Tunable circuits and devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.676198

Filename

676198