Title :
Modulation and noise measurements from 1520 to 1560 nm in monolithic widely tunable semiconductor lasers
Author :
Rigole, P.J. ; Schatz, R. ; Goobar, E. ; Saavedra, A.A.
Author_Institution :
Lab. of Photon. & Microwave Eng., R. Inst. of Technol, Sweden
Abstract :
Summary form only given. Widely tunable semiconductor lasers have a large number of applications. We believe we report for the first time measurements of intensity modulation response, frequency, and intensity noise characteristics of a grating-assisted co-directional coupler with rear sampled grating reflector (GCSR) lasers.
Keywords :
diffraction gratings; distributed Bragg reflector lasers; infrared sources; laser transitions; laser tuning; noise measurement; optical directional couplers; optical testing; semiconductor device testing; semiconductor lasers; waveguide lasers; 1520 to 1560 nm; grating-assisted co-directional coupler; intensity modulation response; intensity noise characteristics; modulation measurements; monolithic widely tunable semiconductor lasers; noise measurements; rear sampled grating reflector lasers; time measurements; widely tunable semiconductor lasers; Frequency; Gratings; Intensity modulation; Laser noise; Noise measurement; Optical coupling; Semiconductor device noise; Semiconductor lasers; Time measurement; Tunable circuits and devices;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676198
