Title :
Deep Trench capacitor drive of a 3.3 GHz unreleased Si MEMS resonator
Author :
Wentao Wang ; Weinstein, D.
Author_Institution :
HybridMEMS Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
This work presents unreleased RF bulk acoustic resonators using Deep Trench (DT) capacitors for both transduction and acoustic isolation. While the majority of Si MEMS resonators require a release step to freely suspend the resonant cavity, these unreleased resonators are formed entirely in solid media. This eliminates the need for complex release steps and costly packaging. The resonators use 1D periodic DT structures etched into a bulk Si substrate for both electrostatic transduction and to form Acoustic Bragg Reflectors (ABRs) for energy localization. In this paper, we introduce the concept of Deep Trenches as ABRs, and provide analysis, simulation, and experimental verification of their use for high-Q resonators. A 3.3 GHz unreleased Si resonator is demonstrated with Q of 2057 and motional impedance RX of 1.2 kΩ. This realization of high-Q unreleased resonators in a bulk Si process provides a high yield, low cost, no packaging solution for on-chip clocking, wireless communication, and electromechanical signal processing.
Keywords :
Q-factor; acoustic resonators; elemental semiconductors; microcavities; micromechanical resonators; silicon; 1D periodic DT structures; ABR; RF bulk acoustic resonators; acoustic bragg reflectors; acoustic isolation; bulk substrate; deep trench capacitor drive; electromechanical signal processing; electrostatic transduction; energy localization; frequency 3.3 GHz; high-Q resonators; motional impedance; on-chip clocking; release step; resistance 1.2 kohm; resonant cavity; solid media; transduction isolation; unreleased MEMS resonator; wireless communication; Acoustics; Capacitors; Cavity resonators; Reflectivity; Resonant frequency; Silicon; Transducers;
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2012.6479045