• DocumentCode
    3543966
  • Title

    Monolithic integration of GaN-based micromechanical resonators and HEMTs for timing applications

  • Author

    Ansari, A. ; Gokhale, Vikrant Jayant ; Roberts, John ; Rais-Zadeh, Mina

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    A platform for intimate integration of high-frequency gallium nitride (GaN) micromechanical resonators and AlGaN/GaN high electron mobility transistors (HEMTs) is reported. For the first time, cascade of a two-port GaN bulk acoustic resonator and AlGaN/GaN HEMT was co-fabricated on a silicon substrate. A high quality factor (Q) of 7413 is reported for a GaN contour-mode resonator at the resonance frequency of 119.8 MHz. More than 30 dB of signal tuning was achieved by using integrated HEMT for signal readout and amplification at the resonator output.
  • Keywords
    III-V semiconductors; Q-factor; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; micromechanical resonators; monolithic integrated circuits; signal processing; silicon; timing circuits; wide band gap semiconductors; AlGaN-GaN; Q; Si; contour-mode resonator; frequency 119.8 MHz; high electron mobility transistors; integrated HEMT; micromechanical resonators; monolithic integration; quality factor; signal amplification; signal readout; signal tun; timing applications; two-port bulk acoustic resonator; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Micromechanical devices; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479049
  • Filename
    6479049