DocumentCode
3543966
Title
Monolithic integration of GaN-based micromechanical resonators and HEMTs for timing applications
Author
Ansari, A. ; Gokhale, Vikrant Jayant ; Roberts, John ; Rais-Zadeh, Mina
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2012
fDate
10-13 Dec. 2012
Abstract
A platform for intimate integration of high-frequency gallium nitride (GaN) micromechanical resonators and AlGaN/GaN high electron mobility transistors (HEMTs) is reported. For the first time, cascade of a two-port GaN bulk acoustic resonator and AlGaN/GaN HEMT was co-fabricated on a silicon substrate. A high quality factor (Q) of 7413 is reported for a GaN contour-mode resonator at the resonance frequency of 119.8 MHz. More than 30 dB of signal tuning was achieved by using integrated HEMT for signal readout and amplification at the resonator output.
Keywords
III-V semiconductors; Q-factor; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; micromechanical resonators; monolithic integrated circuits; signal processing; silicon; timing circuits; wide band gap semiconductors; AlGaN-GaN; Q; Si; contour-mode resonator; frequency 119.8 MHz; high electron mobility transistors; integrated HEMT; micromechanical resonators; monolithic integration; quality factor; signal amplification; signal readout; signal tun; timing applications; two-port bulk acoustic resonator; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Micromechanical devices; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4673-4872-0
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2012.6479049
Filename
6479049
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