DocumentCode :
3544033
Title :
Towards atomistic simulations of the electro-thermal properties of nanowire transistors
Author :
Luisier, Mathieu
Author_Institution :
Integrated Syst. Lab., ETH Zurich, Zürich, Switzerland
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
In this paper, the electronic and thermal properties of ultra-scaled nanowire transistors are investigated using a single, atomistic, quantum transport simulator based on the Non-equilibrium Green´s Function (NEGF) formalism as well as the tight-binding and valence-force-field methods to accurately describe the electron and phonon population, respectively. Although the length of the considered device structures does not exceed a few nanometers, dissipative scattering mechanisms such as electron-phonon and anharmonic phonon-phonon scattering still play an important role and should therefore be fully taken into account by the modeling approach. It will be shown here that these two effects strongly affect the performance of nanowire transistors, either by decreasing (backscattering) or increasing (opening of additional propagation channels) the electrical and thermal currents flowing through them.
Keywords :
Green´s function methods; field effect transistors; nanoelectronics; nanowires; semiconductor device models; tight-binding calculations; NEGF formalism; anharmonic phonon-phonon scattering; atomistic simulations; device structures; dissipative scattering mechanisms; electron population; electron-phonon scattering; electrothermal property; nonequilibrium Green´s function formation; phonon population; quantum transport simulator; tight-binding method; ultrascaled nanowire transistors; valence-force-field methods; Conductivity; Phonons; Scattering; Silicon; Solid modeling; Thermal conductivity; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6479057
Filename :
6479057
Link To Document :
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