Title :
Over sampling and used in temperature compensation for acceleration sensor
Author :
Huang, Gang ; Zhang, Jianping
Author_Institution :
Taiyuan Inst. of Technol., Taiyuan, China
Abstract :
In the test system, a lot of analog tests in need of the A/D conversion. There are two key indicators in A/D conversion, they are effective resolution and signal to noise ratio. Through the theoretical analysis of over-sampling theorem, and the characteristics of white noise signal, A/D converter add 1 each time, the resolution can be 4 times the sampling frequency of over-sampling to achieve. Actual in the temperature test system, using ATmega16 embedded 10-bit ADC, which can successful implementation of a 12-bit ADC conversion accuracy, and improve the measurement resolution.
Keywords :
accelerometers; analogue-digital conversion; capacitive sensors; signal sampling; temperature measurement; temperature sensors; white noise; A/D conversion; ATmega16 embedded ADC; acceleration sensor; capacitive accelerometer; over-sampling theorem; signal sampling; signal-to-noise ratio; temperature compensation; temperature sensor; temperature test system; white noise signal; Acceleration; Frequency conversion; Sampling methods; Sensor phenomena and characterization; Signal analysis; Signal resolution; Signal to noise ratio; System testing; Temperature sensors; White noise; A/D; ADC; AVR; Over sampling; Signal-to-Noise (SNR);
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
DOI :
10.1109/ICEMI.2009.5274455
