Title : 
A non-linear ReRAM cell with sub-1μA ultralow operating current for high density vertical resistive memory (VRRAM)
         
        
            Author : 
Seong-Geon Park ; Min Kyu Yang ; Hyunsu Ju ; Dong-Jun Seong ; Jung Moo Lee ; Eunmi Kim ; Seungjae Jung ; Lijie Zhang ; Yoo Cheol Shin ; In-Gyu Baek ; Jungdal Choi ; Ho-Kyu Kang ; Chilhee Chung
         
        
            Author_Institution : 
Semicond. R&D Center, Samsung Electron. Co. Ltd., Hwasung, South Korea
         
        
        
        
            Abstract : 
A non-linear RRAM cell with sub-1μA ultralow operating current has been successfully fabricated for high density vertical ReRAM (VRRAM) applications. A uniform and reproducible low power resistive switching was achieved by engineering transition metal oxides and imposing thin insulating layer as a tunnel barrier. The non-linear I-V characteristics ensure the possible incorporation of RRAM cell into high density cross-type array structure including VRRAM. By varying the current compliance, a multi level switching behavior was obtained. Moreover, excellent endurance of more than 107 cycles without read disturbance for up to 104 seconds was demonstrated.
         
        
            Keywords : 
low-power electronics; random-access storage; VRRAM; current 1 muA; current compliance; engineering transition metal oxides; high density cross-type array structure; high density vertical ReRAM; high density vertical resistive memory; low power resistive switching; multi level switching behavior; nonlinear I-V characteristics; nonlinear RRAM cell; nonlinear ReRAM cell; thin insulating layer; tunnel barrier; ultralow operating current; Arrays; Electrodes; Flash memory; Metals; Resistance; Switches; Writing;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting (IEDM), 2012 IEEE International
         
        
            Conference_Location : 
San Francisco, CA
         
        
        
            Print_ISBN : 
978-1-4673-4872-0
         
        
            Electronic_ISBN : 
0163-1918
         
        
        
            DOI : 
10.1109/IEDM.2012.6479084