Abstract :
The following topics are dealt with: interconnect design; memory circuits; analog circuits; physical design modeling; nanoelectronics; sensors; signal integrity; advanced packaging; digital VLSI test; and high speed interfaces.
Keywords :
VLSI; analogue circuits; electronics packaging; integrated circuit design; integrated circuit testing; interconnections; nanoelectronics; sensors; storage management chips; advanced packaging; analog circuits; digital VLSI test; high speed interfaces; interconnect design; memory circuits; nanoelectronics; physical design modeling; sensors; signal integrity;
Conference_Titel :
Quality Electronic Design (ASQED), 2012 4th Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4673-2687-2
DOI :
10.1109/ACQED.2012.6320458
