Title :
InGaAs/InP SPAD with improved structure for sharp timing response
Author :
Tosi, Alberto ; Acerbi, Fabio ; Anti, M. ; Zappa, Franco
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
We designed and fabricated a 25 μm active area diameter In0.53Ga0.47As/InP Single-Photon Avalanche Diode (SPAD) with improved layer structure and diffusion geometry in order to achieve good detection efficiency (~30% at 1550 nm), low afterpulsing (gate repetition frequency higher than 1 MHz) and very good timing performance (the timing response has a Full-Width at Half Maximum of about 57 ps at 9 V of excess bias and a fast tail with a time constant of about 30 ps).
Keywords :
III-V semiconductors; avalanche diodes; gallium arsenide; geometry; indium compounds; InGaAs-InP; SPAD; detection efficiency; diffusion geometry; full-width at half maximum; gate repetition frequency; layer structure; sharp timing response; single-photon avalanche diode; time 30 ps; timing performance; voltage 9 V; Detectors; Electric fields; Indium gallium arsenide; Indium phosphide; Logic gates; Photonics; Timing;
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2012.6479095