DocumentCode :
3544475
Title :
The application of boundary-scan technology to FPGA-based experiment system
Author :
Zhao, Hui ; Xiao, Tiejun ; Han, Xiaoru
Author_Institution :
Sch. of Comput. Sci. & Telecommun. Eng., Jiangsu Univ., Zhengjiang, China
fYear :
2009
fDate :
16-19 Aug. 2009
Abstract :
Boundary-scan technology is a popular testing method. Applying boundary-scan technology to FPGA-based remote experiment system is brought forward and realized in the paper. ldquoConfigurerdquo and ldquoverifyrdquo are the two key steps in the process of FPGA-based experiment. Using boundary-scan technology as electric probe, we can realize both of the key steps. To improve the integral preference of the whole remote experiment system, we have designed a hardware boundary-scan controller with VHDL to configure and verify the target FPGA, and it works effectively. This scheme of adopting boundary-scan technology is simple, economical and stable, and has more advantages compared with other schemes. There are no precedents applying boundary-scan testing technology to the experiment system in education field, so the idea is original.
Keywords :
boundary scan testing; field programmable gate arrays; hardware description languages; logic testing; FPGA-based remote experiment system; JTAG testing method; VHDL; boundary-scan technology; electric probe; hardware boundary-scan controller; Application software; Circuit testing; Control systems; Engineering education; Field programmable gate arrays; Hardware; Laboratories; Power generation economics; Probes; System testing; FPGA; boundary-scan controller; boundary-scan technology; remote experiment system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274512
Filename :
5274512
Link To Document :
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