• DocumentCode
    3544499
  • Title

    The research of power quality analysis based on improved S-Transform

  • Author

    Shi, Zhang ; Ruirui, Liu ; Qun, Wang ; Heptol, Jeffers Teargun ; Guimin, Yang

  • Author_Institution
    Dept. of Electron. Inf. Eng., Northeastern Univ., Shenyang, China
  • fYear
    2009
  • fDate
    16-19 Aug. 2009
  • Abstract
    The paper proposes improved S-transform (IST) to detect and classify power quality (PQ) disturbances with time-domain analysis. First, the theory of S-transform (ST) is introduced. To enhance the analytic power of ST in different non-stationary signal processing, IST is achieved by adding an adjustable factor to the Gaussian window function of the normal ST. The adjusted factor changes the velocity in which the width of the window function varies inversely with the frequency. IST possesses an adjustable time-frequency resolution and higher practicability and adaptability than ST in the actual application. IST analysis performed on the PQ disturbance signals can identify the magnitude and duration of the disturbances. The comparison between the wavelet-transform-based method and the improved S-transform-based method for power quality disturbance recognition is also provided. The simulation results show that the proposed method is effective and immune against noise. The proposed method is feasible and promising for practical applications.
  • Keywords
    power supply quality; wavelet transforms; Gaussian window function; adjustable time-frequency resolution; improved S-transform; power quality analysis; wavelet transform-based method; Continuous wavelet transforms; Discrete Fourier transforms; Discrete wavelet transforms; Fast Fourier transforms; Power quality; Signal analysis; Signal processing; Time frequency analysis; Voltage fluctuations; Voltage-controlled oscillators; S-Transform; Wavelet; power quality; voltage disturbance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274515
  • Filename
    5274515