DocumentCode
35445
Title
Fast Analytical Modeling of Dynamic Thermal Behavior of Semiconductor Devices and Circuits
Author
Kwok, Kai H. ; d´Alessandro, Vincenzo
Author_Institution
Skyworks Solutions, Inc., Newbury Park, CA, USA
Volume
61
Issue
4
fYear
2014
fDate
Apr-14
Firstpage
1031
Lastpage
1038
Abstract
This paper presents a set of closed-form analytical expressions to approximate the transient solution to the heat equation without requiring any computationally intensive series summation. The parameters of these expressions can be easily extracted from the physical layout for constructing a thermal impedance matrix to be used in a self-consistent electrothermal circuit simulation of a large number of heat sources. These formulations are derived by assuming a small heat source compared to the chip area in a homogeneous chip with the boundary conditions of an adiabatic top and an isothermal bottom. The derivation allows heat sources to be located at a certain depth from the chip top. The expressions have been verified by comparison with 3-D numerical simulations.
Keywords
integrated circuit modelling; integrated circuit packaging; semiconductor device models; semiconductor device packaging; thermal analysis; thermal management (packaging); analytical modeling; chip area; closed form analytical expressions; dynamic thermal behavior; heat equation; heat source; homogeneous chip; physical layout; self-consistent electrothermal circuit simulation; semiconductor circuits; semiconductor devices; thermal impedance matrix; transient solution; Equations; Heating; Impedance; Integrated circuit modeling; Mathematical model; Thermal analysis; Transient analysis; Electrothermal simulation; heterojunction bipolar transistors (HBT); mutual thermal coupling; self-heating; thermal impedance; transient analysis;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2305991
Filename
6767054
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