An improved phase de-embedding technique for high speed connectors

As high-speed data applications, such as USB 3.0, are coming down to the consumer electronic world, there is a need of accurate methods to characterize channel behavior. This paper investigates further S-parameter phase errors when de-embedding a device under test (DUT) from onboard structures. A fixture model containing a DUT is constructed enabling the determination of the de-embedding solutions. From these solutions, new equations for DUT S-parameter phase sensitivity are developed. The improved method enables accurate de-embedding of the phase of high-speed connectors used in consumer electronics hardware.