Title :
Soft fault test and diagnosis for analog circuits
Author :
Wang, Peng ; Yang, Shiyuan
Author_Institution :
Dept. of Autom., Tsinghua Univ., Beijing, China
Abstract :
A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and a numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issues and multifault diagnosis are also discussed in this paper.
Keywords :
analogue circuits; circuit testing; fault diagnosis; tolerance analysis; SBT diagnosis; analog circuits; analog components; fault models; multifault diagnosis; soft fault test; tolerance; Analog circuits; Automation; Circuit analysis; Circuit faults; Circuit testing; Computational modeling; Digital circuits; Fault diagnosis; System testing; Voltage;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1465055
