DocumentCode
3544633
Title
Soft fault test and diagnosis for analog circuits
Author
Wang, Peng ; Yang, Shiyuan
Author_Institution
Dept. of Autom., Tsinghua Univ., Beijing, China
fYear
2005
fDate
23-26 May 2005
Firstpage
2188
Abstract
A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and a numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issues and multifault diagnosis are also discussed in this paper.
Keywords
analogue circuits; circuit testing; fault diagnosis; tolerance analysis; SBT diagnosis; analog circuits; analog components; fault models; multifault diagnosis; soft fault test; tolerance; Analog circuits; Automation; Circuit analysis; Circuit faults; Circuit testing; Computational modeling; Digital circuits; Fault diagnosis; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN
0-7803-8834-8
Type
conf
DOI
10.1109/ISCAS.2005.1465055
Filename
1465055
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