DocumentCode
3544741
Title
Challenges and approaches in mixed signal RF testing
Author
Soma, Mani
Author_Institution
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fYear
1997
fDate
7-10 Sep 1997
Firstpage
33
Lastpage
37
Abstract
This paper describes the challenges and indicates possible approaches in RF testing, focusing on digital systems, analog subsystems, and integrated mixed-signal systems. The approaches to innovative test techniques to reduce dependence on external automatic test equipment and to mitigate the analog test issues lead to a proposed integrated framework to serve as basis for future test developments. The interdependence between simulation and test is identified to support the framework and eliminate unnecessary test
Keywords
automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; integrated framework; mixed signal RF testing; Automatic test equipment; Automatic testing; Circuit testing; Digital systems; Integrated circuit technology; Logic testing; Process design; RF signals; Radio frequency; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location
Portland, OR
ISSN
1063-0988
Print_ISBN
0-7803-4283-6
Type
conf
DOI
10.1109/ASIC.1997.616973
Filename
616973
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