Title :
Challenges and approaches in mixed signal RF testing
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
This paper describes the challenges and indicates possible approaches in RF testing, focusing on digital systems, analog subsystems, and integrated mixed-signal systems. The approaches to innovative test techniques to reduce dependence on external automatic test equipment and to mitigate the analog test issues lead to a proposed integrated framework to serve as basis for future test developments. The interdependence between simulation and test is identified to support the framework and eliminate unnecessary test
Keywords :
automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; integrated framework; mixed signal RF testing; Automatic test equipment; Automatic testing; Circuit testing; Digital systems; Integrated circuit technology; Logic testing; Process design; RF signals; Radio frequency; System testing;
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-4283-6
DOI :
10.1109/ASIC.1997.616973