• DocumentCode
    3544741
  • Title

    Challenges and approaches in mixed signal RF testing

  • Author

    Soma, Mani

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • fYear
    1997
  • fDate
    7-10 Sep 1997
  • Firstpage
    33
  • Lastpage
    37
  • Abstract
    This paper describes the challenges and indicates possible approaches in RF testing, focusing on digital systems, analog subsystems, and integrated mixed-signal systems. The approaches to innovative test techniques to reduce dependence on external automatic test equipment and to mitigate the analog test issues lead to a proposed integrated framework to serve as basis for future test developments. The interdependence between simulation and test is identified to support the framework and eliminate unnecessary test
  • Keywords
    automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; integrated framework; mixed signal RF testing; Automatic test equipment; Automatic testing; Circuit testing; Digital systems; Integrated circuit technology; Logic testing; Process design; RF signals; Radio frequency; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
  • Conference_Location
    Portland, OR
  • ISSN
    1063-0988
  • Print_ISBN
    0-7803-4283-6
  • Type

    conf

  • DOI
    10.1109/ASIC.1997.616973
  • Filename
    616973