Title :
Systematic CMOS transistor mismatch characterization
Author :
Serrano-Gotarredona, Teresa ; Linares-Barranco, Bernabé
Author_Institution :
Dept. of Analog Design, Nat. Microelectron. Centre, Sevilla, Spain
Abstract :
This paper presents a simple and cheap procedure for characterizing CMOS transistor mismatch. No automatic positioning probe machines are necessary. The technique requires only the use of a host computer, a DC curve tracer (like the HP4145) and a special purpose chip. Characterizations results are given for two processes: the ES2 1.0 μm CMOS process and the CNM 2.5 μm CMOS process
Keywords :
CMOS integrated circuits; integrated circuit measurement; 1.0 micron; 2.5 micron; CMOS transistor mismatch; CNM process; DC curve tracer; ES2 process; HP4145; host computer; special purpose chip; systematic characterization; CMOS process; Circuits; Instruments; MOSFETs; Microelectronics; Noise measurement; Position measurement; Probes; Semiconductor device measurement; Size measurement;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.541913
