• DocumentCode
    3544763
  • Title

    Systematic CMOS transistor mismatch characterization

  • Author

    Serrano-Gotarredona, Teresa ; Linares-Barranco, Bernabé

  • Author_Institution
    Dept. of Analog Design, Nat. Microelectron. Centre, Sevilla, Spain
  • Volume
    4
  • fYear
    1996
  • fDate
    12-15 May 1996
  • Firstpage
    113
  • Abstract
    This paper presents a simple and cheap procedure for characterizing CMOS transistor mismatch. No automatic positioning probe machines are necessary. The technique requires only the use of a host computer, a DC curve tracer (like the HP4145) and a special purpose chip. Characterizations results are given for two processes: the ES2 1.0 μm CMOS process and the CNM 2.5 μm CMOS process
  • Keywords
    CMOS integrated circuits; integrated circuit measurement; 1.0 micron; 2.5 micron; CMOS transistor mismatch; CNM process; DC curve tracer; ES2 process; HP4145; host computer; special purpose chip; systematic characterization; CMOS process; Circuits; Instruments; MOSFETs; Microelectronics; Noise measurement; Position measurement; Probes; Semiconductor device measurement; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3073-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1996.541913
  • Filename
    541913
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3544763