DocumentCode :
3544823
Title :
Performance and area tradeoffs in space-qualified FPGA-based time-of-flight systems
Author :
Hsiong, Whitney ; Huntzicker, Steve ; King, Kevin ; Lee, Austin ; Lim, Chen ; Wang, Jason ; Harris, Sarah ; Jahn, Jög-Micha
Author_Institution :
Harvey Mudd Coll., Claremont, CA, USA
fYear :
2009
fDate :
16-19 Aug. 2009
Firstpage :
42401
Lastpage :
42405
Abstract :
This paper introduces four FPGA-based designs for radiation-tolerant time-of-flight (TOF) systems for sub-atomic particles: Snapshot, Vernier, Fast-Clocking and Hybrid designs. The designs measure TOFs ranging from 0 to 240 ns and are compared based on resolution, thermal performance, FPGA I/O pin usage and area, particle processing rate, and power consumption. All designs are implemented and tested on an Actel ProASIC 3E A3PE1500 FPGA using only the features available on the radiation-tolerant Actel RTAX 2000 S/SL. The designs achieve resolutions of 130 ps to 25 ns and particle rates of 1.63 to 40 MHz, use from 0.02% to 7.5% of the FPGA area, and consume from 396 to 448 mW. The TOF measurements of the fast-clocking design show no thermal variation across the ranges of -25degC to 55degC. The other three designs vary linearly with temperature, but this variation can be calibrated using a temperature sensor. All four designs offer a flexible, inexpensive TOF measurement system that can be implemented across a broad range of FPGAs.
Keywords :
field programmable gate arrays; logic design; logic testing; measurement systems; space vehicle electronics; temperature sensors; Actel ProASIC 3E A3PE1500; Actel RTAX 2000 S/SL; FPGA-based design; TOF measurement system; fast-clocking design; frequency 1.63 MHz to 40 MHz; power 396 mW to 448 mW; radiation-tolerant time-of-flight system; space-qualified FPGA-based time-of-flight system; spaceflight instrumentation; temperature -25 C to 55 C; temperature sensor; time 0 ns to 240 ns; Area measurement; Clocks; Costs; Delay lines; Field programmable gate arrays; Flip-flops; Hardware design languages; Integrated circuit measurements; Plasma measurements; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274555
Filename :
5274555
Link To Document :
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