• DocumentCode
    3544921
  • Title

    Analysis of Insulation Degradation in Epoxy Insulators Using Finite Element Method

  • Author

    Padma, V. ; Raghavan, V. Srinivasa

  • Author_Institution
    Anna Univ. of Technol., Trichy, India
  • fYear
    2012
  • fDate
    8-10 Feb. 2012
  • Firstpage
    498
  • Lastpage
    503
  • Abstract
    The reliability of high voltage power apparatus depends upon the careful design of its insulation and configuration of electrostatic field. The most common failure of the insulation occurs due to the surface insulation failure and the discharges within the void. In this regard, the monitoring and prevention of insulation failure becomes essential for uninterrupted functioning of high voltage power apparatus. Hence the deterioration of Insulation in an Insulator is determined from the analysis of Partial Discharge signals. The Partial Discharge signals are produced by the localized ionization within the electrical field. The Numerical Analysis of Electric field can provide information about the Partial Discharges which is determined by using the Finite Element Method. In this paper the electric field analysis are performed using FEM for the Epoxy insulator at various voltages and frequencies. It can provide information about the degradation of insulation well in advance thus avoiding major break down of power system.
  • Keywords
    electric fields; electrostatic discharge; epoxy insulators; finite element analysis; partial discharges; power apparatus; power transmission reliability; FEM; electric field numerical analysis; electrical field ionization localization; electrostatic field configuration; epoxy insulator; finite element method; high voltage power apparatus reliability; high voltage power apparatus uninterrupted functioning; insulation degradation analysis; insulation deterioration; partial discharge signal analysis; power system breakdown; surface insulation failure monitoring; surface insulation failure prevention; void discharge; Dielectrics; Electric fields; Insulators; Partial discharges; Voltage measurement; Current density; Degradation of Insulation; Dielectric losses; Electric field intensity; Finite Element Method; Partial Discharge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems, Modelling and Simulation (ISMS), 2012 Third International Conference on
  • Conference_Location
    Kota Kinabalu
  • Print_ISBN
    978-1-4673-0886-1
  • Type

    conf

  • DOI
    10.1109/ISMS.2012.132
  • Filename
    6169753