Title :
Efficient redundancy identification for test pattern generation
Author :
Han, Sangyun ; Kang, Sungho
Author_Institution :
Multimedia Processor Center, LG Semicon Co. Ltd., USA
Abstract :
Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient in identifying redundant faults
Keywords :
automatic test software; identification; integrated circuit testing; logic testing; redundancy; ATPG tool; isomorphism identification algorithm; pseudo dominator algorithm; redundancy identification; redundant faults; test pattern generation; Benchmark testing; Central Processing Unit; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Logic; Redundancy; Test pattern generators;
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-4283-6
DOI :
10.1109/ASIC.1997.616977
