Title :
3-D multiphoton laser scanning confocal microscopy as a probe for subsurface defects in polymers
Author :
Bhawalkar, J.D. ; Swiatkiewicz, J.J. ; He, G.S. ; Prasad, P.N. ; Pan, Sinno Jialin ; Samarabandu, J.K. ; Liou, W.S. ; Cheng, P.C.
Author_Institution :
Dept. of Chem., State Univ. of New York, Buffalo, NY, USA
Abstract :
Summary form only given. Confocal laser scanning microscopy (CLSM) provides a significant improvement in axial resolution over conventional epi-fluorescence microscopy by eliminating out-of-focus fluorescence. This is achieved by using a spatial filter in the form of a confocal aperture. The use of IR leads to a larger penetration depth in materials, providing an opportunity to image thicker samples. Furthermore, it is possible to open up the entire visible spectrum for multiple detection channels. The fluorophore, 4-[N-(2-hydroxyethyl-N-methyl) amino phenyl]-4´-(6-hydroxyhexyl sulfonyl)stilbene (APSS), exhibits a strong two-photon absorption at 800 nm, and green upconverted fluorescence emission.
Keywords :
fluorescence; infrared spectra; measurement by laser beam; optical microscopy; optical polymers; optical resolving power; optical scanners; spatial filters; two-photon spectra; 3D multiphoton laser scanning confocal microscopy; polymers; subsurface defects; Apertures; Fluorescence; Image reconstruction; Laser mode locking; Microscopy; Polymers; Probes; Surface cracks; Surface emitting lasers; Surface reconstruction;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2