DocumentCode :
3545831
Title :
Applying functional decomposition for depth minimal technology mapping of multiplexer based FPGAs
Author :
Yeh, Chingwei
Author_Institution :
EE Dept., Nat. Chung-Cheng Univ., Chiayi, Taiwan
fYear :
1997
fDate :
7-10 Sep 1997
Firstpage :
105
Lastpage :
109
Abstract :
Functional decomposition has undergone intensive study in recent literature and gained great success in technology mapping for lookup-table based FPGAs. Yet none has ever attempted at extending such success to other applications. In this work, we move one step further by choosing the multiplexer based FPGAs as the new test bed. Using a typical algorithmic framework and the benchmark test set, we show that functional decomposition can be easily adapted to reduce the logic depth of the mapped network without incurring massive area penalty
Keywords :
automatic testing; delays; field programmable gate arrays; logic testing; multiplexing; algorithmic framework; area penalty; benchmark test set; depth minimal technology mapping; functional decomposition; logic depth; multiplexer based FPGAs; test bed; Benchmark testing; Boolean functions; Data structures; Dynamic programming; Field programmable gate arrays; Libraries; Logic arrays; Logic programming; Logic testing; Multiplexing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
ISSN :
1063-0988
Print_ISBN :
0-7803-4283-6
Type :
conf
DOI :
10.1109/ASIC.1997.616987
Filename :
616987
Link To Document :
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