Title :
An easy approach to formal verification
Author :
Schlipf, T. ; Büchner, T. ; Fritz, R. ; Helms, M.
Author_Institution :
IBM Deutschland Entwicklung GmbH, Boeblingen, Germany
Abstract :
Formal verification suffers from the image that it is complicated and requires a lot of mathematical background to be applied successfully. In this paper a methodology is described that adds formal verification (FV) to the verification process without requiring any knowledge of FV languages. It solely uses the finite state machine notation, which is familiar and intuitive to designers. Another problem of FV is state space explosion. If this occurs we can switch to random simulation within an hour without losing any effort. The results show that FV is at least as fast as random simulation and it is superior in terms of verification quality because it is exhaustive
Keywords :
application specific integrated circuits; circuit CAD; finite state machines; formal verification; integrated circuit design; state-space methods; exhaustive process; finite state machine notation; formal verification; random simulation; state space explosion; verification quality; Automata; Circuit simulation; Circuit testing; Error analysis; Error correction; Formal verification; Logic testing; State-space methods; Switches; System testing;
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-4283-6
DOI :
10.1109/ASIC.1997.616990