Title :
TDD: a technology dependent decomposition algorithm for LUT-based FPGAs
Author :
Farrahi, Amir H. ; Sarrafzadeh, Majid
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A major drawback of the previous algorithms that perform decomposition and covering for LUT-based FPGA technology mapping is the lack of a fast, and reasonably accurate evaluation scheme for the decomposition phase. In this paper, we will show how a fast covering algorithm can be used as an evaluation engine for the decomposition phase. We show that decomposition has a significant impact on the quality of the final mapping result. More specifically, we show that starting from the same circuit topology, a blind decomposition leads to mapping results that use an average of 70 to 150% more LUTs compared to the results obtained using a technology driven decomposition algorithm. A technology driven decomposition algorithm is developed based on the proposed idea. Experiments on a number of MCNC benchmark circuits show an average of 12% to 72% improvement on the number of LUTs compared to the previously reported results
Keywords :
Boolean functions; circuit optimisation; field programmable gate arrays; logic CAD; minimisation of switching nets; network topology; table lookup; LUT-based FPGAs; MCNC benchmark circuits; TDD; blind decomposition; circuit topology; covering algorithm; decomposition phase; evaluation engine; table lookup; technology dependent decomposition algorithm; Boolean functions; Circuit topology; Combinational circuits; Engines; Field programmable gate arrays; Integrated circuit interconnections; Logic circuits; Minimization; Programmable logic arrays; Table lookup;
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-4283-6
DOI :
10.1109/ASIC.1997.617006