DocumentCode :
3546331
Title :
Novel dual-Vth independent-gate FinFET circuits
Author :
Rostami, Masoud ; Mohanram, Kartik
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
fYear :
2010
fDate :
18-21 Jan. 2010
Firstpage :
867
Lastpage :
872
Abstract :
This paper describes gate work function and oxide thickness tuning to realize novel circuits using dual-Vth independent-gate FinFETs. Dual-Vth FinFETs with independent gates enable series and parallel merge transformations in logic gates, realizing compact low power alternatives. Furthermore, they also enable the design of a new class of compact logic gates with higher expressive power and flexibility than conventional forms, e.g., implementing 12 unique Boolean functions using only four transistors. The gates are designed and calibrated using the University of Florida double-gate model into a technology library. Synthesis results for 14 benchmark circuits from the ISCAS and OpenSPARC suites indicate that on average, the enhanced library reduces delay, power, and area by 9%, 21%, and 27%, respectively, over a conventional library designed using FinFETs in 32nm technology.
Keywords :
Boolean functions; MOSFET circuits; logic circuits; logic design; logic gates; work function; Boolean functions; ISCAS benchmark; OpenSPARC benchmark; benchmark circuits; dual-Vth independent-gate FinFET circuits; gate work function; logic gates; oxide thickness tuning; parallel merge transformations; series merge transformations; size 32 nm; Boolean functions; Circuit synthesis; Delay; Double-gate FETs; FinFETs; Libraries; Logic design; Logic devices; Logic gates; Merging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
Type :
conf
DOI :
10.1109/ASPDAC.2010.5419680
Filename :
5419680
Link To Document :
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