DocumentCode
3546393
Title
Dielectric loss factor measurement based on nuttall self-convolution window phase difference correction
Author
Gao, Yunpeng ; Teng, Zhaosheng ; Wang, Jingxun ; Wen, He
Author_Institution
Sch. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
fYear
2009
fDate
16-19 Aug. 2009
Abstract
Some windows which have small side-lobe level and quick fall off rate have been used to eliminate the measurement errors of dielectric loss factor tandelta caused by non-synchronized sampling and non-integral period truncation conditions. A new kind of window called Nuttall Self-Convolution Window (D-Nuttall Window for short) developed by convolving Nuttall Window is presented in this paper. D-Nuttall Window time domain and frequency domain functions are built, an approach for tandelta measurement based on D-Nuttall Window phase difference correction is proposed. The formulas of fundamental initial phase and tandelta are deduced, and the hardware implementation for the measurement system based on this approach is described. D-Nuttall Window with simple structure has smaller side-lobe level and quicker fall off rate than traditional combined cosine windows, and it is unnecessary to solve the high-order equations for spectrum phase difference correction algorithm, which is easy for embedded system realization. The simulation and experiment test results show that D-Nuttall Window function can well suppress spectral leakage, and the influences on tandelta measurement caused by harmonic disturbance, fundamental frequency fluctuation, change in sampling time length and white noise are all restricted by the approach presented in this paper. This approach can be designed and realized easily and has precise and steady measurement results, which can be used in tandelta offline measurement and online monitoring.
Keywords
dielectric loss measurement; error analysis; harmonic analysis; Nuttall self-convolution window phase difference correction; dielectric loss factor measurement; error analysis; harmonic analysis method; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency domain analysis; Frequency measurement; Loss measurement; Measurement errors; Phase measurement; Sampling methods; Time measurement; Dielectric loss factor; Nuttall Self-Convolution Window; error analysis; harmonic analysis method; phase difference correction;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274769
Filename
5274769
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