Title :
PPPS-2013: Emittance and emission from arrays with statistical variation
Author :
Petillo, John J. ; Panagos, Dimitrios N. ; Jensen, Kevin L.
Author_Institution :
Sci. Applic. Int. Corp., Billerica, MA, USA
Abstract :
Summary form only given. We report on the incorporation of a model of field emitters based on a Point Charge Model (PCM)1 that allows for rapid and analytical representations of tip current, variation, and emission statistics and its implementation and usage in the MICHELLE Particle-In-Cell (PIC) code2 to model the impact of emission variation on current characteristics and emittance. Rather than cold field emission characterized by the Fowler Nordheim equation, a General Thermal-Field (GTF) emission model3 treats warm and hot field emission sources. We shall compare the increases in emittance and beam radius due to emission non-uniformity as modeled by assuming a LogNormal (LN) distribution of emitter geometries4. The consequences for high frequency devices shall be explored.
Keywords :
field emission; geometry; log normal distribution; statistical analysis; Fowler Nordheim equation; GTF; LN; MICHELLE particle-in-cell code; PCM; PIC; beam radius; cold field emission source; general thermal-field emission model; geometry; lognormal distribution; point charge model; statistical variation; Analytical models; Equations; Field emitter arrays; Laboratories; Mathematical model; Space charge; Vacuum technology;
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/PLASMA.2013.6633506
