DocumentCode
354657
Title
THz impulse ranging measurements of the late time response
Author
Cheville, R. Alan ; Grischkowsky, D.
Author_Institution
Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
fYear
1996
fDate
2-7 June 1996
Firstpage
82
Abstract
Summary form only given. THz impulse ranging is used to measure the late time response of dielectric targets. The unparalleled time resolution of these measurements provides physical insight into scattering phenomena. We report the highest time resolution ranging measurement of the late time response target to date. Using THz impulse ranging observe for the first time well-resolved features from the delayed time response, predicted from a geometrical optics model. These results permitted the first direct measurement of surface wave velocities on dielectric targets.
Keywords
dielectric measurement; electromagnetic wave scattering; geometrical optics; light scattering; submillimetre wave measurement; THz impulse ranging; THz impulse ranging measurements; delayed time response; dielectric targets; direct measurement; geometrical optics model; late time response; late time response target; physical insight; scattering phenomena; surface wave velocities; time resolution; time resolution ranging measurement; Delay effects; Dielectric measurements; Geometrical optics; Optical scattering; Predictive models; Solid modeling; Surface waves; Time factors; Time measurement; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-443-2
Type
conf
Filename
864388
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