• DocumentCode
    3546606
  • Title

    A CMOS capacitance sensor for cell adhesion characterization

  • Author

    Prakash, Somashekar Bangalore ; Abshire, Pamela ; Urdaneta, Mario ; Smela, Elisabeth

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    3495
  • Abstract
    We describe a CMOS capacitance sensor for measuring the capacitive coupling between living cells and the underlying substrate, a quantity that can be used to characterize cell adhesion strength and cell health. The capacitance sensor operates on the charge sharing principle, mapping sensed capacitance values to voltages. The sensor has been fabricated in a commercially available 0.5 μm, 2-poly 3-metal CMOS technology. Experimental results are presented for bench tests using a micropositioned electrode and in vitro tests with cells cultured directly on the chip surface. The sensor achieves an empirical distance resolution of 3 nm and capacitance resolution of 135 aF. The sensors have been successfully used for long term monitoring of cell viability in vitro.
  • Keywords
    CMOS integrated circuits; biosensors; capacitance measurement; micropositioning; 0.5 micron; CMOS capacitance sensor; bench tests; capacitance resolution; capacitive coupling; cell adhesion characterization; cell health; cell viability; charge sharing principle; empirical distance resolution; in vitro tests; living cells; long term monitoring; micropositioned electrode; underlying substrate; Adhesives; CMOS technology; Capacitance measurement; Capacitive sensors; Cells (biology); Electrodes; In vitro; Sensor phenomena and characterization; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1465382
  • Filename
    1465382