DocumentCode
3546606
Title
A CMOS capacitance sensor for cell adhesion characterization
Author
Prakash, Somashekar Bangalore ; Abshire, Pamela ; Urdaneta, Mario ; Smela, Elisabeth
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
fYear
2005
fDate
23-26 May 2005
Firstpage
3495
Abstract
We describe a CMOS capacitance sensor for measuring the capacitive coupling between living cells and the underlying substrate, a quantity that can be used to characterize cell adhesion strength and cell health. The capacitance sensor operates on the charge sharing principle, mapping sensed capacitance values to voltages. The sensor has been fabricated in a commercially available 0.5 μm, 2-poly 3-metal CMOS technology. Experimental results are presented for bench tests using a micropositioned electrode and in vitro tests with cells cultured directly on the chip surface. The sensor achieves an empirical distance resolution of 3 nm and capacitance resolution of 135 aF. The sensors have been successfully used for long term monitoring of cell viability in vitro.
Keywords
CMOS integrated circuits; biosensors; capacitance measurement; micropositioning; 0.5 micron; CMOS capacitance sensor; bench tests; capacitance resolution; capacitive coupling; cell adhesion characterization; cell health; cell viability; charge sharing principle; empirical distance resolution; in vitro tests; living cells; long term monitoring; micropositioned electrode; underlying substrate; Adhesives; CMOS technology; Capacitance measurement; Capacitive sensors; Cells (biology); Electrodes; In vitro; Sensor phenomena and characterization; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN
0-7803-8834-8
Type
conf
DOI
10.1109/ISCAS.2005.1465382
Filename
1465382
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