DocumentCode
3546697
Title
Silicon-embedded 3D toroidal air-core inductor with through-wafer interconnect for on-chip integration
Author
Yu, Xuehong ; Kim, Minsoo ; Herrault, Florian ; Ji, Chang-Hyeon ; Kim, Jungkwun ; Allen, Mark G.
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2012
fDate
Jan. 29 2012-Feb. 2 2012
Firstpage
325
Lastpage
328
Abstract
This paper presents a CMOS-compatible process for fabrication of 3D structures embedded in the volume of a silicon wafer, and capable of interconnection to circuitry on the wafer surface. The key challenge of embedding structures in the silicon substrate is processing inside deep silicon trenches. This difficulty is overcome by means of several key techniques: multilevel wafer etching; cavity shaping; fine proximity lithography at the bottom of trenches; and laminated dry-film lithography on complex 3D structures. As a technology demonstration, a topologically complex 3D toroidal inductor is fabricated in a deep silicon trench, and is coupled to the wafer surface with high-power, electroplated through-wafer interconnect. Inductors fabricated in these trenches achieved an overall inductance of 60 nH, dc resistance of 399 MΩ, and quality factor of 17.5 at 70 MHz.
Keywords
CMOS integrated circuits; etching; inductors; integrated circuit interconnections; lithography; CMOS compatible process; cavity shaping; dry film lithography; fine proximity lithography; frequency 17.5 MHz; frequency 70 MHz; multilevel wafer etching; on chip integration; silicon embedded 3D toroidal air core inductor; silicon wafer; through wafer interconnect; Conductors; Inductors; Integrated circuit interconnections; Resists; Silicon; Substrates; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location
Paris
ISSN
1084-6999
Print_ISBN
978-1-4673-0324-8
Type
conf
DOI
10.1109/MEMSYS.2012.6170201
Filename
6170201
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