DocumentCode
3546725
Title
Process, voltage and temperature compensation of off-chip-driver circuits for sub-0.25-μm CMOS technology
Author
Chi, Hua ; Stout, Douglas ; Chickanosky, John
Author_Institution
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
fYear
1997
fDate
7-10 Sep 1997
Firstpage
279
Lastpage
282
Abstract
A control circuit that compensates for variations in process, voltage and temperature (PVT) has been developed to control off-chip-driver circuits used for sub-0.25-μm technology. The off-chip-driver (OCD), alone with a simple control scheme, delivers a tight impedance tolerance at the output, improving the output signal waveforms. Across-chip length variation (ACLV), the controlled-circuit design and off-chip-driver performance are also discussed
Keywords
CMOS digital integrated circuits; application specific integrated circuits; compensation; driver circuits; 0.25 micron; control circuit; off-chip driver circuits; offchip drivers; process compensation; submicron CMOS technology; temperature compensation; voltage compensation; CMOS process; CMOS technology; Clocks; Impedance; MOSFET circuits; Microelectronics; Resistors; Rivers; Temperature control; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location
Portland, OR
ISSN
1063-0988
Print_ISBN
0-7803-4283-6
Type
conf
DOI
10.1109/ASIC.1997.617021
Filename
617021
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