Title :
Development of in-situ SEM nano manipulation & MEMS-based testing system with ultra-precision displacement sensors for nanomechanics of MWCNTs
Author :
Omori, Hideaki ; Sadakata, Mitsutaka ; Tsubokura, Ikko ; Hanasaki, Itsuo ; Isono, Yoshitada
Author_Institution :
Grad. Sch. of Eng., Kobe Univ., Kobe, Japan
fDate :
Jan. 29 2012-Feb. 2 2012
Abstract :
We have developed the in situ scanning electron microscopy (SEM) nanomaterial manipulation & testing system including newly designed Electrostatically Actuated NAnotensile Testing devices (EANATs), in order to investigate mechanical properties and fracture mechanisms of multi-walled carbon nanotubes (MWCNTs). The novel EANAT can measure uniaxial tensile elongation of nanomaterials by the capacitive sensor integrated into the lever motion amplification system. The nanomaterial manipulation system functions to pick up single MWCNTs from a substrate and to fix it on the EANAT. We have succeeded in obtaining a clear load-displacement curve of a single MWCNT, and the Young´s modulus of MWCNT was determined to be 625 to 628 GPa. Furthermore, its interlayer sliding and breaking mechanisms were examined in detail.
Keywords :
Young´s modulus; capacitive sensors; carbon nanotubes; displacement measurement; electrostatic actuators; elongation; fracture mechanics; mechanical variables measurement; microsensors; nanomechanics; nanosensors; nanostructured materials; scanning electron microscopy; tensile testing; test equipment; C; EANAT design; MEMS-based testing system; MWCNT; Young´s modulus; capacitive sensor; electrostatically actuated nanotensile testing devices; fracture mechanisms; in situ scanning electron microscopy; in-situ SEM nanomaterial manipulation; interlayer breaking mechanism; interlayer sliding mechanism; lever motion amplification system; load-displacement curve; mechanical properties; multiwalled carbon nanotubes; nanomaterial manipulation; nanomechanics; ultra-precision displacement sensors; uniaxial tensile nanomaterial elongation; Actuators; Capacitive sensors; Electron beams; Nanoscale devices; Probes; Substrates;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-0324-8
DOI :
10.1109/MEMSYS.2012.6170215