DocumentCode :
3546824
Title :
Experimental and modeling analysis on entrainment condition of submicrometer thick Si micro mechanical resonators with nonlinear coupling element
Author :
Tanno, Keitaro ; Kawai, Yusuke ; Ono, Takahito
Author_Institution :
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear :
2012
fDate :
Jan. 29 2012-Feb. 2 2012
Firstpage :
563
Lastpage :
566
Abstract :
In this paper, the synchronization of coupled resonators is investigated. Mechanically coupled three resonators are fabricated, and the synchronized condition of these resonators is evaluated. When the frequency of external driving force approaches to the lowest resonant frequency of the coupled resonators, the entrainment of resonance occurred in other resonators, where the frequency ratios become integer and their phase differences are locked. Moreover, the width of the entrainment region is dependent on the amplitude of resonators. Using a basic physical model of the coupled three resonators, we estimated the coupling springs, which show a strong nonlinearity.
Keywords :
elemental semiconductors; micromechanical resonators; silicon; synchronisation; Si; coupled resonator synchronization; coupling springs; entrainment condition; external driving force approach; nonlinear coupling element; physical model; submicrometer thick micromechanical resonators; Couplings; Frequency measurement; Optical resonators; Resonant frequency; Springs; Synchronization; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location :
Paris
ISSN :
1084-6999
Print_ISBN :
978-1-4673-0324-8
Type :
conf
DOI :
10.1109/MEMSYS.2012.6170238
Filename :
6170238
Link To Document :
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