DocumentCode :
3546868
Title :
High voltage SOI VLD PMOS with charge-balanced surface super junction layer
Author :
Ming Qiao
Author_Institution :
No.58 Res. Inst., China Electron. Technol. Group Corp., Wuxi, China
Volume :
2
fYear :
2013
fDate :
15-17 Nov. 2013
Firstpage :
366
Lastpage :
369
Abstract :
A novel high voltage SOI VLD (Variation of Lateral Doping) PMOS, which has a charge-balanced surface super junction (SJ) layer, is proposed. VLD layer yields an enhanced spread of space charge region to sustain the applied high voltage during the forward blocking mode. Charge balance and maximum breakdown voltage (BV) occur when the doping concentration of the p pillars is slightly higher than that of the n pillars. Further reduction of specific on-resistance (Ron, sp) for a given BV is achieved by utilizing high aspect ratio surface SJ pillars. Simulation results show that the proposed PMOS with Ld=35 μm and NA=ND=1E17 cm-3 can achieve a BV of 582 V and Ron, sp of 210 mΩ·cm2, leading to a power figure of merit (FOM) of 1.6 MW·cm-2.
Keywords :
MOS integrated circuits; electric breakdown; impurity distribution; power integrated circuits; semiconductor doping; silicon-on-insulator; space charge; charge balanced surface super junction layer; charge-balanced surface super junction layer; doping concentration; enhanced spread; forward blocking mode; high voltage SOI VLD PMOS; maximum breakdown voltage; space charge region; variation of lateral doping PMOS; Avalanche breakdown; Doping; Electric fields; Junctions; Silicon-on-insulator; Simulation; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems (ICCCAS), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-3050-0
Type :
conf
DOI :
10.1109/ICCCAS.2013.6765358
Filename :
6765358
Link To Document :
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