Title :
Recognition of power quality events using wavelet-based dynamic structural neural networks
Author :
Hsiao, Ying-Tung ; Chuang, Cheng-Long ; Jiang, Joe-Air
Author_Institution :
Dept. of Electr. Eng., Tamkang Univ., Taipei, Taiwan
Abstract :
Recognition of power-quality (PQ) events by analyzing the voltage and current waveform disturbances is a very important task for the power system monitoring. In this work, a hybrid of wavelet transformation and dynamic structural neural network (DSNN) approach is introduced for PQ events classification. The PQ waveform is first decomposed by four level Daubechies-8 wavelet analysis, and the decomposed waveforms then be processed by the DSNN for PQ event classification. By utilizing the DSNN, the PQ event recognition system can be implemented with minimum neurons and produces maximum performance. Moreover, the proposed method can adapt more training patterns without manually revising the neural network system. The proposed approach is implemented in a simulation program by C++ language to verify the validation and classification accuracy.
Keywords :
discrete event simulation; fluctuations; neural nets; power system analysis computing; power system measurement; power system stability; power system transients; signal classification; wavelet transforms; C++ language simulation program; DSNN; PQ events classification; PQ waveform; classification accuracy; current waveform disturbances; decomposed waveforms; dynamic structural neural network approach; four level Daubechies-8 wavelet analysis; power quality event recognition; power system monitoring; training patterns; validation accuracy; voltage waveform disturbances; wavelet transformation; wavelet-based dynamic structural neural networks; Artificial neural networks; Continuous wavelet transforms; Hidden Markov models; Hybrid power systems; Neural networks; Neurons; Power quality; Power system dynamics; Wavelet domain; Wavelet transforms;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1465479