Title :
Test board design and measurement techniques for high-frequency fully-differential CMOS OTAs
Author :
Chiang, David Hsiu-Chun ; Schaumann, Rolf ; Daasch, W. Robert
Author_Institution :
Dept. of Electr. Eng., Portland State Univ., OR, USA
Abstract :
Experimental procedures and a versatile circuit board designed for testing fully-differential CMOS OTAs are presented. The techniques can be used to measure most DC and AC parameters of an OTA. The approach used leads to guidelines for OTA design
Keywords :
CMOS analogue integrated circuits; differential amplifiers; integrated circuit measurement; integrated circuit testing; operational amplifiers; AC parameters; DC parameters; high-frequency fully-differential CMOS OTA; measurement technique; test board design; CMOS technology; Capacitors; Circuit testing; Distortion measurement; Impedance; Measurement techniques; Power measurement; Power supplies; Resistors; Transconductance;
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-4283-6
DOI :
10.1109/ASIC.1997.617030
