Title :
Rapid measurement of AFP using AFP-specific aptamer on a microfluidic chip
Author :
Huang, Chao-Jyun ; Lin, Hsin-I ; Shiesh, Shu-Chu ; Lee, Gwo-Bin
Author_Institution :
Dept. of Eng. Sci., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
Jan. 29 2012-Feb. 2 2012
Abstract :
This study presents a new suction-type microfluidic system capable of rapid measurement of alpha-fetoprotein (AFP) by utilizing magnetic bead-based technologies. Two modules, including a suction-type incubator for the magnetic beads to capture AFP and acridinium ester (AE)-labeled anti-AFP antibodies and a microfluidic control module for sample transportation, were integrated into this microfluidic system. With the incorporation of AFP-specific aptamer-conjugated magnetic beads, the target AFP could be recognized and attracted onto the surface of the magnetic beads from the clinical sample. The entire process including two-step incubation and purification process could be automatically performed within 25 min, which is only about 20% of the time required when using a benchtop machine (for about 130 min). Besides, the total sample and reagent volume consumed is only 105 μL, which is significantly less than that required in a large system (410 μL). More importantly, experimental results showed that clinical human serum samples can also be accurately analyzed. The microfluidic system may be promising for point-of-care applications for AFP detection in the future.
Keywords :
bioMEMS; biological techniques; microfluidics; molecular biophysics; proteins; purification; AFP-specific aptamer-conjugated magnetic beads; acridinium ester-label; alpha-fetoprotein; benchtop machine; clinical human serum samples; magnetic bead-based technologies; microfluidic chip; microfluidic control module; point-of-care applications; rapid measurement; suction-type incubator; suction-type microfluidic system; time 25 min; two-step incubation processing; two-step purification processing; Biomembranes; Immune system; Indexes; Magnetic liquids; Microfluidics; Proteins; Semiconductor device measurement;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-0324-8
DOI :
10.1109/MEMSYS.2012.6170325