Title :
Large scale computing system EMI test philosophy
Author :
Soohoo, Kwok M. ; Wu, Chang-Yu
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
The purpose of the paper is to discuss the testing philosophy of large system EMI testing and some of the methods used to reduce the test logistics and complexity; it is also for Regulatory Agents to consider when writing up EMC rules. Actual test data are given to substantiate the rationales behind the test methods
Keywords :
computer testing; electromagnetic compatibility; legislation; EMC rules; EMI test philosophy; Regulatory Agents; complexity; large scale computing system; parallel system; scalar system; test data; test logistics; test methods; Electromagnetic compatibility;
Conference_Titel :
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ELMAGC.1997.617040
