Title :
Patterning of the second-order susceptibility of an asymmetric quantum well waveguide by ion implantation enhanced quantum well intermixing
Author :
Janz, S. ; Buchanan, M. ; Delobel, L. ; Van Der Meer, P. ; Wasilewski, Zbigniew R. ; Xu, D.-X. ; Akano, U.G. ; Mitchell, I.V. ; Piva, P.G. ; Fiore, A.
Author_Institution :
Inst. for Microstruct. Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
Summary form only given. We presents measurements of the intermixing-induced changes in second harmonic generation (SHG) efficiency of an asymmetric quantum well (AQW) superlattice waveguide after a patterned ion implantation. Determining the second order nonlinear optical susceptibility for SHG in intermixed AQWs provides useful information for WDM wavelength conversion, because the susceptibility for SHG is similar to the susceptibility for DFG when the signal and difference frequencies are almost equal, as is the case for WDM applications. Each AQW consists of a 2.7-nm GaAs well coupled to a 1.5-nm GaAs well through a 1.2-nm AlGaAs layer, and the coupled well pairs are separated by 16.0-nm AlGaAs barriers.
Keywords :
III-V semiconductors; gallium arsenide; ion implantation; nonlinear optical susceptibility; optical harmonic generation; semiconductor quantum wells; semiconductor superlattices; 1.5 nm; 16 nm; 2.7 nm; AlGaAs; AlGaAs barriers; AlGaAs layer; GaAs; GaAs well; SHG efficiency; WDM applications; WDM wavelength conversion; asymmetric quantum well superlattice; asymmetric quantum well waveguide; coupled well pairs; difference frequencies; intermixed AQWs; intermixing-induced changes; ion implantation enhanced quantum well intermixing; patterned ion implantation; second harmonic generation; second order nonlinear optical susceptibility; second-order susceptibility; second-order susceptibility patterning; superlattice waveguide; Gallium arsenide; Ion implantation; Optical harmonic generation; Optical waveguides; Optical wavelength conversion; Particle beam optics; Superlattices; Waveguide transitions; Wavelength division multiplexing; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676554