Title :
A divide-and-conquer approach to estimating minimum/maximum leakage current
Author :
Liao, Guang-Wan ; Feng, Ja-Shong ; Lin, Rung-Bin
Author_Institution :
Graduate Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Forcing primary inputs and memory elements into certain logic values is a viable method to lower standby leakage current for CMOS circuits. The paper presents a divide-and-conquer approach to finding an input vector that leads a circuit into a low (high) leakage state. With only a small fraction of time, our approach can achieve up to 11% smaller leakage than the lowest and up to 20% larger leakage than the highest, respectively, attainable with 100K random vectors for the large ISCAS benchmark circuits. Our results are as good as those obtained by simulated annealing and genetic algorithms that run for a very long time. Due to its divide-and-conquer nature, it is scalable for even larger circuits.
Keywords :
CMOS logic circuits; CMOS memory circuits; leakage currents; power consumption; CMOS circuits; ISCAS benchmark circuits; divide-and-conquer approach; genetic algorithms; high leakage state; input vector; low leakage state; maximum leakage current estimation; minimum leakage current estimation; power consumption; simulated annealing; CMOS logic circuits; Circuit testing; Gate leakage; Genetic algorithms; Leakage current; Logic circuits; Logic devices; Stacking; Threshold voltage; Vectors;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1465686