Title :
An Nth order central symmetrical layout pattern for nonlinear gradients cancellation
Author :
Dai, Xin ; He, Chengming ; Xing, Hanqing ; Chen, Degang ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
In this paper, systematic mismatch due to parameter gradients is modeled and analyzed. A new layout strategy with flexible cell placement is proposed. Theoretical analysis shows its property of canceling the mismatch between two devices due to up to nth order gradient effects by using 2n unit cells for each device. Simulation results show that the proposed technique gives better matching characteristics than other existing layout techniques under nonlinear gradients.
Keywords :
integrated circuit layout; mixed analogue-digital integrated circuits; central symmetrical layout pattern; flexible cell placement; nth order gradient effects; nonlinear gradients cancellation; parameter gradients; systematic mismatch; Analog-digital conversion; Capacitors; Circuit simulation; Fabrication; Helium; Mirrors; Mixed analog digital integrated circuits; Pipelines; Polynomials; Sampling methods;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1465715