• DocumentCode
    3547678
  • Title

    A two-chip, 4-MHz, microelectromechanical reference oscillator

  • Author

    Sundaresan, Krishnakumar ; Ho, Gavin K. ; Pourkamali, Siavash ; Ayazi, Farrokh

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    5461
  • Abstract
    The paper describes a 4-MHz temperature compensated reference oscillator based on a capacitive silicon micro-mechanical resonator. The design of the resonator has been optimized to offer large quality factors (22000), while maintaining tunability in excess of 3000 ppm for fine tuning and temperature compensation. Oscillations are sustained with a CMOS amplifier and temperature compensation is performed with a novel resonator bias generator. When interfaced with the bias circuit, the oscillator exhibits a temperature drift of 380 ppm over a 90°C range, a 6 times improvement in stability over an uncompensated oscillator. The sustaining amplifier and compensation circuitry were fabricated in a 2P3M 0.5 μm CMOS process. The oscillator is designed to prototype highly stable, low phase-noise reference oscillators integrated at the chip or package level.
  • Keywords
    CMOS analogue integrated circuits; Q-factor; amplifiers; compensation; integrated circuit design; micromechanical resonators; oscillators; phase noise; 0.5 micron; 25 to 115 C; 4 MHz; CMOS amplifier; Q-factor; Si; capacitive silicon micro-mechanical resonator; compensation circuitry; fine tuning; low phase-noise reference oscillators; microelectromechanical reference oscillator; quality factor; resonator bias generator; sustaining amplifier; temperature compensated reference oscillator; tunability; CMOS process; Circuit optimization; Circuit stability; Design optimization; Oscillators; Prototypes; Q factor; Silicon; Temperature distribution; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1465872
  • Filename
    1465872