• DocumentCode
    3547689
  • Title

    Far-infrared streak camera [using Rydberg atom photocathode]

  • Author

    Noordam, L.D. ; Drabbels, M. ; Lankhuijzen, G.M. ; Rella, C.

  • Author_Institution
    ROM-AMOLF, Amsterdam, Netherlands
  • fYear
    1998
  • fDate
    3-8 May 1998
  • Firstpage
    519
  • Lastpage
    520
  • Abstract
    Summary form only given. The spectral range at which conventional streak camera systems operate is limited by the spectral response of the photocathode used. For most photocathode materials, the sensitivity is limited to wavelengths shorter than 1.5 /spl mu/m. Beyond this wavelength, the quantum efficiency of the photocathode becomes negligible. The temporal profile of mid- and far-infrared light pulses can thus not be measured directly using a conventional streak camera. We constructed an atomic streak camera in which the photocathode used in conventional streak cameras is replaced by a sample of gas phase Rydberg atoms for the conversion from photons to electrons. Due to the low binding energy of the electrons of Rydberg atoms, the IR photon energy is already sufficient to photoionize the atoms and create electrons. The combination of a low ionization threshold with the high photoionization cross section makes a Rydberg atom photocathode very suitable for use in an IR streak camera.
  • Keywords
    Rydberg states; image convertors; infrared imaging; photocathodes; photoionisation; streak cameras; IR photon energy; Rydberg atom photocathode; atomic streak camera; far-infrared streak camera; gas phase Rydberg atoms; high photoionization cross section; low binding energy; low ionization threshold; photon to electron conversion; streak images; Atomic beams; Atomic measurements; Cameras; Cathodes; Electrons; Ionization; Optimized production technology; Pulse measurements; Silicon compounds; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-339-0
  • Type

    conf

  • DOI
    10.1109/CLEO.1998.676575
  • Filename
    676575