DocumentCode
3547699
Title
Digital self-correction of time-interleaved ADCs
Author
Harpe, Pieter ; Zanikopoulos, Athon ; Van Roermund, Arthur
Author_Institution
Mixed-signal Microelectron. Group, Eindhoven Univ. of Technol., Netherlands
fYear
2005
fDate
23-26 May 2005
Firstpage
5541
Abstract
A well known problem of time-interleaved ADCs is the matching between the individual channels. Any mismatch affects the accuracy adversely. The random mismatch between the channels originates mainly from the mismatch of components like transistors and capacitors. To achieve a certain degree of matching between the channels, the sizes of the individual components have to be chosen accordingly. Especially for high-resolution ADCs, this means that physically large transistors are required. Instead, one can also start with an analog circuit that is relatively inaccurate in itself (allowing physically small devices), and use a digital post-correction technique to correct for the actual deviations of each component. With this method, a high accuracy can be obtained while the requirements for the components are relaxed significantly. Although these techniques have been available for single-channel converters for many years, techniques correcting the mismatch between several channels are scarce. In this paper, an existing algorithm for single-channel pipelined ADCs is extended to include inter-channel correction as well, requiring almost no additional hardware.
Keywords
analogue-digital conversion; calibration; error compensation; ADC accuracy; ADC digital self-correction; component mismatch; digital calibration algorithm; digital post-correction technique; high-resolution converters; individual channel mismatch; inter-channel mismatch correction; pipelined converters; time-interleaved ADC; Analog circuits; Analog-digital conversion; Calibration; Capacitors; Digital-to-frequency converters; Energy consumption; Frequency conversion; Hardware; Microelectronics; Pipelines;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN
0-7803-8834-8
Type
conf
DOI
10.1109/ISCAS.2005.1465892
Filename
1465892
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