DocumentCode :
3547798
Title :
Read-out circuit in RT-fluxgate
Author :
Baglio, S. ; Sacco, V. ; Bulsara, Adi R.
Author_Institution :
DIEES, Universita degli studi di Catania, Italy
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
5910
Abstract :
The residence time fluxgate magnetometer approach is based on the characterization of the time spent by the core magnetization in each of the two stable equilibrium states of the potential function, that underpins the dynamic of a typical ferromagnetic core, when a (carefully configured) periodic excitation signal is applied. This time domain technique presents several interesting features and, in particular, it can be implemented by using bias signals having lower amplitude and frequency than those used in conventional fluxgate processing schemes. In this paper we present the RT-fluxgate magnetometer and the design of an analog-digital conditioning circuit for reading out the magnetic field information carried on spikes time position in the output waveform.
Keywords :
CMOS integrated circuits; fluxgate magnetometers; magnetic cores; magnetic field measurement; readout electronics; CMOS; RT-fluxgate read-out circuit; RTD-fluxgate; analog-digital conditioning circuit; core magnetization stable equilibrium states; ferromagnetic core periodic excitation; magnetic field measurement; potential function equilibrium states; residence time fluxgate magnetometer; spikes time position contained information; Circuits; Coils; Magnetic anisotropy; Magnetic cores; Magnetic fields; Magnetic sensors; Magnetization; Magnetometers; Perpendicular magnetic anisotropy; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
Type :
conf
DOI :
10.1109/ISCAS.2005.1465984
Filename :
1465984
Link To Document :
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