Femtosecond two-photon microscopy of nonlinear photodetectors

Author

Zeller, J. ; Doth, P. ; Rudolph, W. ; Scheik-Bahae, M.

Author_Institution

Dept. of Phys. & Astron., New Mexico Univ., Albuquerque, NM, USA

fYear

1998

fDate

3-8 May 1998

Firstpage

538

Lastpage

539

Abstract

Summary form only given. We report on nonlinear microscopic imaging of detectors under two-photon excitation. Such nonlinear detectors have recently received much attention for their application in femtosecond laser pulse diagnostics. A laser scanning microscope illuminated by a fs Ti:sapphire laser was used to image a ZnSe photodetector and a light emitting diode (LED) as a detector. The ZnSe detector, fabricated with an interdigitated finger structure had Ag/Ti metalization contacts and was operated in the photoconductive mode. The surface-emitting InAlGaP high-brightness LED was operated in the photovoltaic mode.

Keywords

II-VI semiconductors; high-speed optical techniques; laser variables measurement; light emitting diodes; optical microscopy; photodetectors; two-photon processes; zinc compounds; Ag/Ti metalization contacts; InAlGaP; ZnSe; ZnSe detector; ZnSe photodetector; femtosecond laser pulse diagnostics; femtosecond two-photon microscopy; fs Ti:sapphire laser; interdigitated finger structure; laser scanning microscope; light emitting diode; nonlinear detectors; nonlinear microscopic imaging; nonlinear photodetectors; photoconductive mode; photovoltaic mode; surface-emitting InAlGaP high-brightness LED; two-photon excitation; Detectors; Laser applications; Laser excitation; Laser modes; Light emitting diodes; Microscopy; Optical pulses; Photodetectors; Surface emitting lasers; Zinc compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.676601

Filename

676601