DocumentCode :
3548039
Title :
Femtosecond two-photon microscopy of nonlinear photodetectors
Author :
Zeller, J. ; Doth, P. ; Rudolph, W. ; Scheik-Bahae, M.
Author_Institution :
Dept. of Phys. & Astron., New Mexico Univ., Albuquerque, NM, USA
fYear :
1998
fDate :
3-8 May 1998
Firstpage :
538
Lastpage :
539
Abstract :
Summary form only given. We report on nonlinear microscopic imaging of detectors under two-photon excitation. Such nonlinear detectors have recently received much attention for their application in femtosecond laser pulse diagnostics. A laser scanning microscope illuminated by a fs Ti:sapphire laser was used to image a ZnSe photodetector and a light emitting diode (LED) as a detector. The ZnSe detector, fabricated with an interdigitated finger structure had Ag/Ti metalization contacts and was operated in the photoconductive mode. The surface-emitting InAlGaP high-brightness LED was operated in the photovoltaic mode.
Keywords :
II-VI semiconductors; high-speed optical techniques; laser variables measurement; light emitting diodes; optical microscopy; photodetectors; two-photon processes; zinc compounds; Ag/Ti metalization contacts; InAlGaP; ZnSe; ZnSe detector; ZnSe photodetector; femtosecond laser pulse diagnostics; femtosecond two-photon microscopy; fs Ti:sapphire laser; interdigitated finger structure; laser scanning microscope; light emitting diode; nonlinear detectors; nonlinear microscopic imaging; nonlinear photodetectors; photoconductive mode; photovoltaic mode; surface-emitting InAlGaP high-brightness LED; two-photon excitation; Detectors; Laser applications; Laser excitation; Laser modes; Light emitting diodes; Microscopy; Optical pulses; Photodetectors; Surface emitting lasers; Zinc compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
Type :
conf
DOI :
10.1109/CLEO.1998.676601
Filename :
676601
Link To Document :
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